Microstructural and optical characterization of germanium:indium tin oxide (Ge:ITO) nanocomposite films

Authors: C.G. Allen, G.H. Shih, B.G. Potter Jr

The nanophase assembly and resulting optical and electronic properties of Ge:ITO composite thin films, produced by a sequential RF-sputtering deposition approach, were manipulated via deposition conditions and subsequent isochronal thermal anneals. The study examined the combined influences of thermally induced changes in phase crystallinity, semiconductor-phase morphology, and Ge–ITO interfacial structure on properties of relevance to photovoltaic function.

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