Microstructural and optical characterization of germanium:indium tin oxide (Ge:ITO) nanocomposite ﬁlms
Authors: C.G. Allen, G.H. Shih, B.G. Potter Jr
The nanophase assembly and resulting optical and electronic properties of Ge:ITO composite thin ﬁlms, produced by a sequential RF-sputtering deposition approach, were manipulated via deposition conditions and subsequent isochronal thermal anneals. The study examined the combined inﬂuences of thermally induced changes in phase crystallinity, semiconductor-phase morphology, and Ge–ITO interfacial structure on properties of relevance to photovoltaic function.